{"id":634,"date":"2021-11-14T21:49:26","date_gmt":"2021-11-14T12:49:26","guid":{"rendered":"https:\/\/aem-www.imr.tohoku.ac.jp\/dev\/cints\/?page_id=634"},"modified":"2021-11-23T10:18:38","modified_gmt":"2021-11-23T01:18:38","slug":"fields","status":"publish","type":"page","link":"https:\/\/www.cints.tohoku.ac.jp\/en\/fields\/","title":{"rendered":"Supporting Fields"},"content":{"rendered":"\n

CINTS provides an open access to the facilities in the following fields, located in the several departments in the university.<\/p>\n\n\n\n

Field<\/th>Department<\/th> Content <\/th><\/tr><\/thead>
Microstructural Characterization<\/strong>\"\"<\/td>\u25cfInstitute for Materials and Research<\/a>

\u25cf1-MV Electron Microscope Section,
Technology Center for Research and Education Activities<\/td>		Open access to various electron microscopes (TEMs and SEMs). Specimen preparation using focused-ion beam (FIB). Observation on behalf of users is also available.<\/td><\/tr>
Molecule
\uff06
Material Synthesis<\/strong>\"\"<\/td>		\u25cfWPI-AIMR Advanced Institute for Materials Research<\/a>

\u25cfResearch and Analytical Center for Giant Molecules, Graduate School of Science<\/a><\/td>		Synthesis of functional and bioactive molecules on consignment. Open access to analytical facilities including NMR and ICP.<\/td><\/tr>
Nanofabrication(MEMS)<\/strong>\"\"<\/td>Hands-on-access fabrication facility, Micro System Integration Center<\/a><\/td>Open access to facilities in a spacious cleanroom (1800 m2), necessary for MEMS and device fabrication, with hands-on training by qualified staff members.<\/td><\/tr><\/tbody><\/table><\/figure>\n\n\n\n

<\/p>\n","protected":false},"excerpt":{"rendered":"

CINTS provides an open access to the facilities in the following fields, located in the several departments in the university. Field Department Content Microstructural Characterization \u25cfInstitute for Materials and Research \u25cf1-MV Electron Microscope Section,Technology Center for Research and Education Activities Open access to various electron microscopes (TEMs and SEMs). Specimen preparation using focused-ion beam (FIB). … Supporting Fields<\/span><\/a><\/p>\n","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_lmt_disableupdate":"no","_lmt_disable":"","_locale":"en_US","_original_post":"https:\/\/www5.local\/?page_id=23","footnotes":""},"class_list":["post-634","page","type-page","status-publish","hentry","en-US"],"jetpack_shortlink":"https:\/\/wp.me\/Pdwa86-ae","jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/634","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/comments?post=634"}],"version-history":[{"count":1,"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/634\/revisions"}],"predecessor-version":[{"id":635,"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/pages\/634\/revisions\/635"}],"wp:attachment":[{"href":"https:\/\/www.cints.tohoku.ac.jp\/wp-json\/wp\/v2\/media?parent=634"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}